Nonlinear Optical Characterization of Deuterated Silicon-Rich Nitride Waveguides

Xavier X. Chia,G. F. R. Chen,Yu Cao,Doris K. T. Ng,Peng Xing,Dawn T. H. Tan
DOI: https://doi.org/10.1364/nlo.2021.nm2a.7
2021-01-01
Abstract:Nonlinear optical characterization of Silicon-Rich Nitride waveguides fabricated using deuterated silane are presented. Fourier Transform Infrared Spectroscopy reveals the absence of Si-H and N-H related bonds known to cause optical absorption close to a wavelength of 1550nm.
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