A Comparison of Total-Ionizing-Dose Effects in Silicon and Silicon-Nitride Waveguides

Brett L. Ringel,Jeffrey W. Teng,Mozhgan Hosseinzadeh,Delwyn G. Sam,Peter J. Francis,Hari Parameswaran,Arielle Little,George N. Tzintzarov,Daniele M. Monahan,Stephen D. LaLumondiere,John D. Cressler
DOI: https://doi.org/10.1109/tns.2024.3415502
IF: 1.703
2024-08-21
IEEE Transactions on Nuclear Science
Abstract:The total-ionizing-dose (TID) responses of silicon and low-loss silicon-nitride (SiN) integrated waveguides are evaluated. Mach-Zehnder interferometers (MZIs), which allow for both TID-induced changes in effective refractive index ( ) and transmission losses to be observed, were exposed to 10-keV highly localized X-ray pulses facilitating very high dose irradiation for small exposure areas. TID-induced shifts in and transmission losses were observed for both waveguide types above 3 Mrad(Si), with the silicon waveguides exhibiting better radiation resilience for both metrics. Data collected were used to create Ansys Lumerical simulations to propose potential mechanisms of TID-induced degradation in waveguides. Furthermore, to better understand the effects of degradation on other passive components, both silicon and SiN TID-damaged ring resonators were simulated in MATLAB. Differences in changes and transmission losses imply that for high dose environments (>10 Mrad(Si)), when comparing waveguide types, silicon waveguides will provide similar loss performance and comparably smaller shifts in compared to typically lower-loss SiN waveguides.
engineering, electrical & electronic,nuclear science & technology
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