≪title>infrared Measurements of CVD Diamond Films</title>

Xiaohong Wang,L. J. Pilione,Wei Zhu,Walter A. Yarbrough,W. Drawl,R. Messier
DOI: https://doi.org/10.1117/12.22455
1990-01-01
Abstract:The growth surfaces of CVD diamond films are usually rough with polycrystalline crystallographic habits which presents a severe problem if CVD diamond films are to be used in infrared optics. Several methods are described in this paper in an effort to solve this problem. A polishing process was used to reduce the surface roughness by polishing the rough growth surface with a heated cast iron scaife. For polished films, near 70% transmittance was obtained over the whole range of 600-4000 cm-1, while the transmittance for non-polished films were much lower and varied strongly with the wavenumber. Absorptions believed due to carbon-hydrogen stretching bands and a silicon carbide phase were observed in the transmission spectra of polished diamond films.
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