Study on the growth of CVD diamond thin films by in situ reflectivity measurement

Jinlong Luo,Xuantong Ying,Peinan Wang,Liangyao Chen
DOI: https://doi.org/10.1016/S0925-9635(02)00183-8
IF: 3.806
2002-01-01
Diamond and Related Materials
Abstract:Study on the growth of CVD diamond thin films by in situ reflectivity measurement was reported. SEM pictures show that the time dependent reflectivity is related to the evolution of the surface morphology. According to the principle of multiple beam interference, we present in this work a mathematical model to interpret laser reflectance interference on the surface of the growing diamond films. Using this model, a reflectivity curve was fitted. The optical refractive index, the surface roughness and the growth rate of the polycrystalline diamond thin films were determined from the fitted results in real time. Therefore, this is a useful method to study the growth of CVD diamond thin films.
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