Abstract:Despite the great potential of microplasma optical emission spectrometry (OES) for on-site analysis, it remains a challenge to achieve the fast, sensitive, batch, and multielement analysis of trace heavy metals in a complex matrix. Herein, a novel ultrasonic nebulization-accelerated gas-phase enrichment (GPE) following in situ microplasma desorption sampling approach is employed for the determination of trace heavy metals by a miniature dielectric barrier discharge (DBD)-OES device. The volatile heavy metal species obtained by hydride generation (HG) can be quickly separated from the complex matrix under the action of ultrasonic nebulization, adsorbed on the surface of the activated carbon electrode tip for GPE, and then in situ desorbed and excited by DBD microplasma to achieve multielement OES analysis. With an array nebulizer plate, a batch of 10 samples can be handled for GPE in 40 s, and DBD-OES analysis is maintained at a rate of 6 s per sample. Under the optimized conditions, the detection limits for simultaneous determinations of Hg, Cd, Cu, and Sn are 0.005, 0.01, 0.03, and 0.04 μg L-1, respectively, and the detection sensitivities are about 164, 157, 132, and 91-fold improved with respect to those of the conventional HG-DBD-OES mode, respectively. The accuracy and practicability are verified by measuring several certified reference materials. This fast GPE plus in situ DBD-OES analysis strategy possesses the features of simple operation, time-savings, and low cost, contributing to volatile species transport, matrix interference elimination, and device miniaturization for field applications.

Feasibility of applying microsecond-pulse glow discharge time of flight mass spectrometry in surface depth analysis

Feasibility of applying microsecond-pulse glow discharge time of flight mass spectrometry in surface depth analysis1This paper was published on the Special Issue from the BCEIA Conference in Shanhhai, China, October 1997.1

Development of Microwave Plasma Torch Mass Quadrupole Spectrometer

Analytical Performance of a Microsecond-pulse Glow Discharge Time of Flight Mass Spectrometer.

Weighting Ratio Correction Method for Depth Profiling Using Microsecond Pulsed Glow Discharge Mass Spectrometry

Microsecond Pulsed Glow Discharge Time‐of‐flight Mass Spectrometer

Depth Profiling of Thin Films with Pulsed Glow Discharge Atomic Emission Spectrometry

Approaching Standardless Quantitative Elemental Analysis of Solids: Microsecond Pulsed Glow Discharge and Buffer-Gas-Assisted Laser Ionization Time-of-Flight Mass Spectrometry

Depth profiling of nanometer thin layers by pulsed micro-discharge with inductively coupled plasma mass spectrometry

Depth Profiling Of Nanometer Thin Layers By Laser Desorption And Laser Postionization Time-Of-Flight Mass Spectrometry

Buffer-gas Assisted High Irradiance Femtosecond Laser Ionization Orthogonal Time-of-flight Mass Spectrometry for Rapid Depth Profiling

Depth Profiling of Nanometer Coatings by Low Temperature Plasma Probe Combined with Inductively Coupled Plasma Mass Spectrometry.

Pulsed microdischarge with inductively coupled plasma mass spectrometry for elemental analysis on solid metal samples.

Suppression of Gas Species Signals in Direct Current Glow Discharge Time-Of-Flight Mass Spectrometry

Microsecond-Pulsed Glow Discharge Time-Of-Flight Mass Spectrometry: Analytical Advantages

Explicit chemical speciation by microsecond pulsed glow discharge time-of-flight mass spectrometry: concurrent acquisition of structural, molecular and elemental information

Plasma Profiling Time-of-Flight Mass Spectrometry for Fast Elemental Analysis of Semiconductor Structures with Depth Resolution in the Nanometer Range

Ultrasonic Nebulization-Accelerated Gas-Phase Enrichment Following in Situ Microplasma Desorption for Analysis of Trace Heavy Metals by Optical Emission Spectrometry.

Some Innovative Features in Microwave Plasma Source Based Time-of-Flight Mass Spectrometry

Development and Evaluation of a Glow Discharge Microwave-Induced-Plasma Tandem Source for Time-of-Flight Mass Spectrometry

[Study of the Excitation and Diffusion Processes of Sample Atoms in a Microwave Boosted Microsecond-Pulse Glow Discharge Source with Optical Emission Spectrometry].