[Progress in the application of laser ablation ICP-MS to surface microanalysis in material science]

Yong Zhang,Yun-hai Jia,Ji-wen Chen,Xue-jing Shen,Ying Liu,Leiz Zhao,Dong-ling Li,Peng-cheng Hang,Zhen Zhao,Wan-lun Fan,Hai-zhou Wang
Abstract:In the present paper, apparatus and theory of surface analysis is introduced, and the progress in the application of laser ablation ICP-MS to microanalysis in ferrous, nonferrous and semiconductor field is reviewed in detail. Compared with traditional surface analytical tools, such as SEM/EDS (scanning electron microscopy/energy dispersive spectrum), EPMA (electron probe microanalysis analysis), AES (auger energy spectrum), etc. the advantage is little or no sample preparation, adjustable spatial resolution according to analytical demand, multi-element analysis and high sensitivity. It is now a powerful complementary method to traditional surface analytical tool. With the development of LA-ICP-MS technology maturing, more and more analytical workers will use this powerful tool in the future, and LA-ICP-MS will be a super star in elemental analysis field just like LIBS (Laser-induced breakdown spectroscopy).
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