A New Generation 700 V BCD Technology that Integrates Quadruple-RESURF LDMOS with Best-in-Class Specific On-Resistance

Ming Qiao,Dican Hou,Yue Gao,Dingxiang Ma,Jiawei Wang,Bo Zhang
DOI: https://doi.org/10.1109/ISPSD57135.2023.10147667
2023-01-01
Abstract:A new generation 700 V Bipolar-CMOS-DMOS (BCD) technology is reported in this work, which integrates quadruple-RESURF LDMOS with best-in-class specific on-resistance ( <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$R_{\text{on},\text{sp}}$</tex> ). By introducing PNPN layer in the drift region to locally increase the doping concentration of deep N-type well (DNW) and provide lower on-resistance conduction paths, the quadruple-RESURF LDMOS with PNPN layer (PNPN LDMOS) can achieve low <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$R_{\text{on},\text{sp}}$</tex> of 62.5 m Ω.cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> and high breakdown voltage (BV) of 739 V, whose <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$R_{\text{on},\text{sp}}$</tex> is 40.8% lower than that of the mass-produced triple-RESURF LDMOS. The corresponding analytical silicon limit of PNPN LDMOS is derived as <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$R_{\text{on},\text{sp}}= 5.93\times 10^{-6}\times 153\times BV^{l.67}$</tex> , which is well verified by simulated and measured results at 500 to 700 V breakdown level. Besides, parasitic or independent JFET with competitive saturation drain current ( <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$I_{\text{Dsat}}$</tex> ) is also fabricated in the BCD technology. The measured results indicate that the fabricated JFET can achieve competitive <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$I_{\text{Dsat}}$</tex> of 66.5 µA/µm.
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