CVD Graphene Contacts for Lateral Heterostructure MoS_2 Field Effect Transistors

Daniel S. Schneider,Leonardo Lucchesi,Eros Reato,Zhenyu Wang,Agata Piacentini,Jens Bolten,Damiano Marian,Enrique G. Marin,Aleksandra Radenovic,Zhenxing Wang,Gianluca Fiori,Andras Kis,Giuseppe Iannaccone,Daniel Neumaier,Max C. Lemme
DOI: https://doi.org/10.1038/s41699-024-00471-y
IF: 10.516
2024-01-01
npj 2D Materials and Applications
Abstract:Intensive research has been carried out on two-dimensional materials, in particular molybdenum disulfide, towards high-performance field effect transistors for integrated circuits1. Fabricating transistors with ohmic contacts is a challenging task due to the formation of a high Schottky barrier that severely limits the performance of the transistors for real-world applications. Graphene-based heterostructures can be used in addition to, or as a substitute for unsuitable metals. In this paper, we present lateral heterostructure transistors made of scalable chemical vapor-deposited molybdenum disulfide and chemical vapor-deposited graphene achieving a low contact resistances of about 9 kΩ·µm and high on/off current ratios of 108. Furthermore, we also present a theoretical model calibrated on our experiments showing further potential for scaling transistors and contact areas into the few nanometers range and the possibility of a substantial performance enhancement by means of layer optimizations that would make transistors promising for use in future logic integrated circuits.
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