Abstract:This paper presents a single-coarse dual-fine architecture that improves energy-efficiency of pipelined-SAR analog-to-digital converters (ADCs). A coarse and fast sub-ADC is used to quantize the most significant bits (MSBs), which are encoded with a proposed residue transformation method to control the residue generation of the first stages in two fine channels. The residue voltages generate on the capacitive digital-to-analog converters (C-DACs) of split fine channels directly without successive approximation processes. Therefore, the conversion rate is increased and the power is reduced. A shuffle mechanism is introduced into split-ADC based digital background calibration to avoid the divergence of the conventional algorithm in the proposed architecture. A high-energy-efficiency dynamic amplifier is also introduced as the residue amplifier. A 14-bit 60-MS/s ADC is prototyped in a 28-nm CMOS process. The digital calibration engine operates under 0.9-V supply, other parts of the ADC core operate under 1.05-V supply. The ADC core consumes 4.26 mW. Measurement results show that the calibration improved the signal-to-noise and distortion ratio (SNDR) and spur-free dynamic range (SFDR) dramatically, the calibrated ADC achieves SNDR and SFDR of 66.9 dB and of 91.0 dB respectively, translating to a Schreier FoM of 165.4 dB and a Walden FoM of 39.3 fJ/conversion-step.

A 2.5-Gs/s Time-Interleaved SAR-Assisted Ringamp-Based Pipelined ADC with Digital Background Calibration

A 16-Bit 2.5-Ms/s SAR ADC with On-Chip Foreground Calibration

A 2.5-Gs/s Four-Way-Interleaved Ringamp-Based Pipelined-SAR ADC with Digital Background Calibration in 28-Nm CMOS

A 14-bit 500MS/s and 1GS/s Configurable Pipelined ADC with Background Calibration

A 14-Bit 500-Ms/s Pipelined-SAR ADC in 28-Nm CMOS with Foreground and Background Calibration

An 18-Bit 2MSPS SAR ADC with Double Passive Noise-Shaping Calibration

A 12-Bit 2.32gs/s Pipelined/sar Hybrid ADC with a High-Linearity Input Buffer.

A 14bit 500MS/s 85.62dBc SFDR 66.29dB SNDR SHA-less pipelined ADC with a stable and high-linearity input buffer and aperture-error calibration in 40nm CMOS

A 200ms/s, 11 Bit SAR-assisted Pipeline ADC with Bias-Enhanced Ring Amplifier.

A 625ms/s, 12-Bit, SAR Assisted Pipeline ADC with Effective Gain Analysis for Inter-stage Ringamps

A 71.5-Db SNDR 475-Ms/s Ringamp-Based Pipelined SAR ADC with On-Chip Bit-Weight Calibration

A Time-Interleaved SAR Assisted Pipeline ADC with a Bias-Enhanced Ring Amplifier.

A 12-Bit 1.5-Gs/s Single-Channel Pipelined SAR ADC with a Pipelined Residue Amplification Stage

A 800 MS/s, 12-Bit, Ringamp-Based SAR Assisted Pipeline ADC with Gain Error Cancellation

A 12-Bit 110ms/s 4-Stage Single-Opamp Pipelined SAR ADC with Ratio-Based GEC Technique

All-Digital Background Calibration of a Pipelined-SAR ADC Using the "split ADC" Architecture.

A 12b 1GS/s Pipelined ADC with Digital Background Calibration of Inter-stage Gain, Capacitor Mismatch, and Kick-back Errors

A 48-Mw, 12-Bit, 150-Ms/s Pipelined ADC with Digital Calibration in 65nm CMOS

A 91.0-Db SFDR Single-Coarse Dual-Fine Pipelined-SAR ADC with Split-Based Background Calibration in 28-Nm CMOS.

A 2.9-mW 11-b 20-MS/s pipelined ADC with dual-mode-based digital background calibration

A Single-Channel 1.25-Gs/s 11-Bit Pipelined ADC with Robust Floating-Powered Ring Amplifier and First-Order Gain Error Calibration.