Abstract:This work presents a 14-bit 500 MS/s single-channel pipelined-successive-approximation-register (SAR) analog-to-digital converter (ADC) with an adaptively biased floating inverter amplifier (AB-FIA) as the residue amplifier (RA) and a hybrid reference ripple mitigation (H-RRM) technique to relax the power and area burden on the reference stabilization. Leveraging the adaptively biased architecture in the last stage FIA, the speed and open-loop gain of the proposed two-stage FIA are enhanced compared with the conventional cascode counterpart. Besides, the impact of the reference error on the pipelined-SAR conversion accuracy is alleviated by hybridizing the improved reference ripple cancellation (RRC), reference ripple neutralization (RRN), and reference buffer (RBUF). The improved RRC removes the potential noise coupled from the floating capacitor to counter the decision error during the sub-SAR conversion in the first stage. Meanwhile, the RRN facilitates a rapid reference recovery. These acts constitute the H-RRM, which assists a high-speed and high-resolution pipelined-SAR process with a relaxed integrated reference RBUF with low-power and compact area. The prototype ADC was fabricated in a 28 nm CMOS process; it consumes 6.34 mW total power at 500 MS/s, including 2.4 mW dynamic power of RBUF. It occupies an active area of 0.018 mm $^{2}$ , which the ADC core area of 0.0168 mm $^{2}$ and the area of RBUF with a 2.3 pF decoupling capacitor is 0.00105 mm $^{2}$ . The measured signal to noise and distortion ratio (SNDR) and spurious free dynamic range (SFDR) are 64.2 dB and 80.55 dB with a Nyquist input, respectively, leading to a 170.2 dB Schreier figure-of-merit (FoM) (FoM $_{\mathrm{S}}$ ) and 9.6 fJ/conversion-step Walden FoM (FoM $_{\mathrm{W}}$ ).

A 91.0-Db SFDR Single-Coarse Dual-Fine Pipelined-SAR ADC with Split-Based Background Calibration in 28-Nm CMOS.

A 16-Bit 2.5-Ms/s SAR ADC with On-Chip Foreground Calibration

A 14-Bit 500-Ms/s Pipelined-SAR ADC in 28-Nm CMOS with Foreground and Background Calibration

An 18-Bit 2MSPS SAR ADC with Double Passive Noise-Shaping Calibration

A 14bit 500MS/s 85.62dBc SFDR 66.29dB SNDR SHA-less pipelined ADC with a stable and high-linearity input buffer and aperture-error calibration in 40nm CMOS

A 14-bit 500MS/s and 1GS/s Configurable Pipelined ADC with Background Calibration

A 12-Bit 2.32gs/s Pipelined/sar Hybrid ADC with a High-Linearity Input Buffer.

A 1.5 Mw 68 Db SNDR 80 Ms/s 2<formula Formulatype="inline"> <tex Notation="TeX">$\times$</tex></formula> Interleaved Pipelined SAR ADC in 28 Nm CMOS

A 12-Bit 1.5-Gs/s Single-Channel Pipelined SAR ADC with a Pipelined Residue Amplification Stage

A 2.5-Gs/s Four-Way-Interleaved Ringamp-Based Pipelined-SAR ADC with Digital Background Calibration in 28-Nm CMOS

A 14b 500 MS/s Single-Channel Pipelined-SAR ADC With Reference Ripple Mitigation Techniques and Adaptively Biased Floating Inverter Amplifier

A 12-Bit 40 Ms/S Pipelined Adc With Over 80 Db Sfdr

An energy-efficient reconfigurable 18/12-bit 1MS/s pipelined-SAR ADC

A 2-Mw 70.7-Db SNDR 200-Ms/s Pipelined-SAR ADC Using Continuous-Time SAR-Assisted Detect-and-Skip and Open-Then-Close Correlated Level Shifting

9.1 A 2mW 70.7dB SNDR 200MS/s Pipelined-SAR ADC with Continuous-Time SAR-Assisted Detect-and-Skip and Open-then-Close Correlated Level Shifting.

A 1.5-MHz BW 81.2-dB SNDR Dual-Residue Pipeline ADC With a Fully Dynamic Noise-Shaping Interpolating-SAR ADC

A calibration-free 10.7 fJ/conv.-step 12-bit 120-MS/s pipelined SAR ADC in 40nm CMOS

A Calibration-Free, 16-Channel, 50-Ms/s, 14-Bit, Pipelined-SAR ADC with Reference/Op-Amp Sharing and Optimized Stage Resolution Distribution

A 12-bit 1.1GS/s Pipelined-SAR ADC With Adaptive Inter-Stage Redundancy in 28 nm CMOS

All-Digital Background Calibration of a Pipelined-SAR ADC Using the "split ADC" Architecture.

A 68.5 Db-Sndr, 12.4-Fj/conv.-step, 100-Ms/s Pipelined-Sar ADC with PVT-enhanced Circuitry