Abstract:Many applications, such as multi-standard wireless and event-driven IoT devices, demand high-resolution ADCs with scalable sampling rate and power consumption. The conventional pipelined ADC can achieve high resolution, but its power does not scale well with the sampling rate due to the use of a closed-loop static OTA for residue amplification. While the OTA can be turned off to save power, it requires considerable time for the bias circuit and CMFB loop to settle when waking up, leading to wasted power and reduced peak operation frequency. Using an open-loop dynamic amplifier can make power scale linearly with frequency, but its gain varies with PVT and often requires background calibration, which converges slowly and is incompatible with event-driven applications. The ring-amp is a promising solution as it features closed-loop operation, easy duty-cycling, and decaying power over time [1]-[4]. However, its stability depends on the dead zone size, which typically requires trimming across PVT variations. Besides, the 1st stage has a constant operating point during amplification, which consumes considerable energy. A recent work proposed a 2-stage floating inverter amplifier (FIA) that is fully dynamic and works in closed-loop [5]. It guarantees stability and does not need dead zone control. Moreover, the power consumptions of all stages decay over time naturally. Nevertheless, its low open-loop gain of 33dB is inadequate for a high-resolution pipelined ADC, and its fast-quenching 2 <sup>nd</sup> stage reduces the amplifier speed, limiting the usage in high-speed designs.

A Single-Channel 1.25-Gs/s 11-Bit Pipelined ADC with Robust Floating-Powered Ring Amplifier and First-Order Gain Error Calibration.

Modeling of a 14-bit, 100-MS/s pipelined ADC with digital nonlinearity calibration

A 14-bit 500MS/s and 1GS/s Configurable Pipelined ADC with Background Calibration

A 14bit 500MS/s 85.62dBc SFDR 66.29dB SNDR SHA-less pipelined ADC with a stable and high-linearity input buffer and aperture-error calibration in 40nm CMOS

A Calibration Scheme for a 800-Ms/s 14 Bit Pipelined ADC in 28-Nm CMOS

A Maximum-Likelihood-Estimation-Based Digital Background Calibration Technique for Interstage Gain Error in Pipelined ADCs

A 2.5-Gs/s Time-Interleaved SAR-Assisted Ringamp-Based Pipelined ADC with Digital Background Calibration

A 625ms/s, 12-Bit, SAR Assisted Pipeline ADC with Effective Gain Analysis for Inter-stage Ringamps

A 71.5-Db SNDR 475-Ms/s Ringamp-Based Pipelined SAR ADC with On-Chip Bit-Weight Calibration

A Fast and Cost-Effective Calibration Strategy of Inter-Stage Residual Amplification Errors for Cyclic-Pipelined ADCs

A 2.5-Gs/s Four-Way-Interleaved Ringamp-Based Pipelined-SAR ADC with Digital Background Calibration in 28-Nm CMOS

A 10b 1.25GS/s Residue Post-Amplified Pipelined-SAR ADC with Supply-and-Temperature Stabilized Open-Loop Residue Amplifier.

A 800 MS/s, 12-Bit, Ringamp-Based SAR Assisted Pipeline ADC with Gain Error Cancellation

A 0.004mm2 200MS/S Pipelined SAR ADC with Kt/c Noise Cancellation and Robust Ring-Amp

A 0.4-to-40MS/s 75.7dB-SNDR Fully Dynamic Event-Driven Pipelined ADC with 3-Stage Cascoded Floating Inverter Amplifier

A power-efficient 14-bit 250MS/s pipelined ADC

A 12-Bit 110ms/s 4-Stage Single-Opamp Pipelined SAR ADC with Ratio-Based GEC Technique

A 14-Bit 500-Ms/s Pipelined-SAR ADC in 28-Nm CMOS with Foreground and Background Calibration

A 172Db-Fom Pipelined SAR ADC Using a Regenerative Amplifier with Self-Timed Gain Control and Mixed-Signal Background Calibration

A 12-Bit 40 Ms/S Pipelined Adc With Over 80 Db Sfdr

A 50MS/s 80dB SFDR digital calibrated pipelined ADC with workload-balanced MDAC