Influence of the Thickness of a SiO2 Reflective Layer on the Performance of a Structured CsI(Tl) Scintillation Screen Based on an Oxidized Si Micropore Array Template in X-ray Imaging.

Zhixiang Sun,Mu Gu,Yunxue Teng,Xiaolin Liu,Bo Liu,Juannan Zhang,Shiming Huang,Chen Ni
DOI: https://doi.org/10.1364/oe.459637
IF: 3.8
2022-01-01
Optics Express
Abstract:To obtain better light guidance and optical isolation effects under a limited microcolumn wall thickness, the influence of the thickness of a SiO2 reflective layer on the performance of a structured CsI(Tl) scintillation screen based on an oxidized Si micropore array template in X-ray imaging was simulated. The results show that the SiO2 reflective layer should maintain a certain thickness to achieve good light-guide performance. However, if the template is entirely composed of SiO2, the light isolation performance of the microcolumn wall will be slightly worse. The results provide a basis for optimizing the thickness of SiO2 reflective layer.
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