MBE growth and X-ray study of high-quality cubic-GaN on GaAs(001)

Li Zilan,H. Chen,Hongjun Liu,J. H. Li,Lingyu Wan,Shuangtao Liu,Qizhang Huang,J.M. Zhou
DOI: https://doi.org/10.1016/s0022-0248(99)00474-1
IF: 1.8
2000-01-01
Journal of Crystal Growth
Abstract:Abstract High-quality cubic GaN epilayer on GaAs(0 0 1) was grown by molecular beam epitaxy equipped with radio frequency nitrogen source. The optimized growth condition is to grow two monolayers thick initial GaN at 600°C under As atmosphere. X-ray diffraction rocking curve shows that the full-width at half-maximum of cubic GaN(0 0 2) diffraction peak is 10 arcmin. The X-ray reciprocal space mapping is used to identify the secondary hexagonal phase and estimate their relative content.
What problem does this paper attempt to address?