STUDIES OF ELECTRONIC TRANSPORT PROPERTIES OF POLYCRYSTALLINE Sm X C 60

Shiyan Li,Chen Xianhui,Kaidong Ruan,Gui Feng Zhou,Guochun Zhang,Cao Liezhao
DOI: https://doi.org/10.7498/aps.47.1847
IF: 0.906
1998-01-01
Acta Physica Sinica
Abstract:The electrical transport of polycrystalline samples Sm x C 60 has been investigated by resistivity and magnetoresistance (MR) measurements.The transport mechanism is different for the samples with different x in Sm x C 60 system.The temperature dependent resistivity can be explained by the fluctuation induced tunneling model for the sample SmC 60 .The transport properties for the sample Sm 2 75 C 60 appear to be dominated by weak localization and electron electron interactions.The MR data of the sample Sm 2 75 C 60 can be fitted by a weak localized model with strong electron electron interactions,but that of the sample SmC 60 cannot.
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