Study of Microstructure and Anomalous Variation of Resistivity in Metal-C-60 Multilayer Thin-Films

WB ZHAO,KJ LUO,J CHEN,JL ZHANG,CY LI,DL YIN,ZN GU,XH ZHOU,ZX JIN
DOI: https://doi.org/10.1016/0038-1098(92)90899-k
IF: 1.934
1992-01-01
Solid State Communications
Abstract:The structure and electrical transport properties of C60 thin films and some metal-C60 multilayer thin films were studied. We find the resistance decreases sharply when adding C60 on some specific metal layers. There are two possible explainations: one is the formation of a conduction layer of metal doped C60, the other is the bonding interfacial interaction between the metal and C60 layers, which may result a better continuous metal layer.
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