Electronic Transport Properties Of Polycrystalline Smxc60

X. Chen,S. Li,G. Qian,K. Ruan,L. Cao
DOI: https://doi.org/10.1103/PhysRevB.57.10770
IF: 3.7
1998-01-01
Physical Review B
Abstract:The electrical transport of polycrystalline samples SmxC60 has been investigated by resistivity and magnetoresistance (MR) measurements. The transport mechanism is different for the samples with different x in SmxC60 system. The temperature-dependent resistivity can be explained by the fluctuation-induced-tunneling model for the sample SmC60. The transport properties for the sample Sm2.75C60 appear to be dominated by weak localization (WL) and electron-electron interactions. The MR data of the sample SmC60 cannot be fitted by a weak-localized model with strong electron-electron interactions. The anomalous large MR of the sample SmC60 seems not to be explained by a change within the metallic regions, and could arise from the insulating barriers. [S0163-1829(98)07417-7].
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