Abstract:Cerium dioxide (CeO2)/yttria-stabilized zirconia (YSZ) has long been proven to be an effective buffer layer architecture for high-temperature superconducting coated conductors. In this study, CeO2 films were deposited on YSZ (001) single crystal substrates via reactive unbalanced magnetron sputtering with varying substrate temperature, sputtering pressure, radio frequency sputtering power, and film thickness. High-quality texture was achieved even at ambient temperature, and deposition parameters were optimized to achieve the best degree of in-plane alignment with (111) phi scan full width at half maximum around 1.3 degrees. Atomic force microscopy was utilized to investigate film surface morphology and roughness. At a low sputtering pressure, a flat and uniform film surface comprising nano-sized isotropic islands was observed. The surface islands transited to an anisotropic spindle-like shape at pressure higher than 1.0 Pa. The spindle-shaped islands elongated along the CeO2 [110] or [1 (1) over bar0] directions, constructing an interwoven surface morphology. The distinct surface morphology evolution was correlated with the change in the film strain state attributed to varying sputtering pressure. A possible mechanism for this morphology evolution was discussed. (C) 2013 Elsevier B.V. All rights reserved.

Defects in heteroepitaxial CeO2/YSZ/Si(0 0 1) films by precise X-ray rocking curve distribution fitness

Defects in heteroepitaxial CeO2/YSZ/Si(001) films by precise X-ray rocking curve distribution fitness

Characterization of defect type and dislocation density in double oxide heteroepitaxial CeO 2 /YSZ/Si(001) films

Influence of ultra-thin YSZ layer on heteroepitaxial CeO2/YSZ/Si(0 0 1) films analyzed by X-ray reciprocal space map

Distinct Correlation Between CeO 2 and YSZ in Out-of-plane and In-Plane Mosaic Dispersions of Heteroepitaxial CeO 2 /ysz/si(001) Films

Effects of deposition temperature on structural defect and electrical resistivity in heteroepitaxial La0.5Sr0.5CoO3/CeO2/YSZ/Si films

Effects of deposition temperature on structural defect and electrical resistivity in heteroepitaxial La[sub 0.5]Sr[sub 0.5]CoO[sub 3]/CeO[sub 2]/YSZ/Si films

Atomically smooth CeO2(001) films on YSZ(001)

Interfacial Defects in YBa2Cu3O7-δ/SrTiO3(0 0 1) Heterostructures Studied by Aberration-Corrected Ultrahigh-Resolution Electron Microscopy

Visualization of oxygen vacancies at CeO x /Y-HZO interface by spectrum imaging method and multivariate analysis

Surface Morphology Evolution of CeO2/YSZ (001) Buffer Layers Fabricated Via Magnetron Sputtering

Influence of Defects in SiC (0001) on Epitaxial Graphene

Mechanical and Electronic Properties of CeO 2 under Uniaxial Tensile Loading: A DFT Study

Thickness and Roughness Analysis on Ysz/Si(001) Epitaxial Films with Ultra Thin Sio2 Interface by X-Ray Reflectivity

Interaction of YBCO Thin Film and Substrates and Its Effects on the Quality of the Film

Effects of Thermal Coefficient and Lattice Constant Mismatches on Mosaic Dispersion of Heteroepitaxial YSZ/Si(001) Thin Films

Polaronic defects in monolayer CeO2: Quantum confinement effect and strain engineering

Bulk Conduction and Relaxation in [(zro2)1−x(ceo2)x]0.92(y2o3)0.08 (0 ≤ X ≤ 1) Solid Solutions at Intermediate Temperatures

Morphology and defect structure of the CeO2(111) films grown on Ru(0001) as studied by scanning tunneling microscopy

Morphology and defect structure of the CeO2(1 1 1) films grown on Ru(0 0 0 1) as studied by scanning tunneling microscopy

Effects of Deposition Temperature on Structure and Resistivity of Epitaxial La<sub>0.5</sub>Sr<sub>0.5</sub>CoO<sub>3</sub>/CeO<sub>2</sub>/YSZ/Si(001) Films