Abstract:The limits of chip technology are constantly being pushed with the continuous development of integrated circuit manufacturing processes and equipment. Currently, chips contain several billion, and even tens of billions, of transistors, making chip testing increasingly challenging. The verification of very large-scale integrated circuits (VLSI) requires testing on specialized automatic test equipment (ATE), but their cost and size significantly limit their applicability. The current FPGA-based ATE is limited in its scalability and support for few test channels and short test vector lengths. As a result, it is only suitable for testing specific chips in small-scale circuits and cannot be used to test VLSI. This paper proposes a low-cost hardware and software solution for testing digital integrated circuits based on design for testability (DFT) on chips, which enables the functional and performance test of the chip. The solution proposed can effectively use the resources within the FPGA to provide additional test channels. Furthermore, the round-robin data transmission mode can also support test vectors of any length and it can satisfy different types of chip test projects through the dynamic configuration of each test channel. The experiment successfully tested a digital signal processor (DSP) chip with 72 scan test pins (theoretically supporting 160 test pins). Compared to our previous work, the work in this paper increases the number of test channels by four times while reducing resource utilization per channel by 37.5%, demonstrating good scalability and versatility.

Overview of FPGA and CPLD Device Testing Techniques Based on ATE

FATE: A Flexible FPGA-Based Automatic Test Equipment for Digital ICs

Design for HW/SW Co-Testing Based on FPGA

A Full Coverage Test Method for Configurable Logic Blocks in Fpga

Implement of EDA Design Using FPGA & CPLD

Method and system for testing on site programmable gate array

A Novel Full Coverage Test Method for CLBs in FPGA (abstract Only).

A Novel Scheme for Application-Dependent Testing of FPGAs

A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

Testing and Diagnosis for Both Interconnect Resources and CLBs in Virtex Series FPGAs

BIST-based test and diagnosis of FPGA logic blocks

Development and Optimization Design of Digital Logic device based on FPGA

Chip Tester Based on FPGA Commonly Used in Laboratory

A novel layout automation flow to facilitate test chip design for standard cell characterization

Research on CPLD Application in Manufacturing Test of CP's Distribution Frame

Research on an Intelligent Test Method for Interconnect Resources in an FPGA

Test Methods For Fpga Switching Characteristics On Gpete Test Platform

A New Built-In Self-Test Method for Functional Test of Configurable Logic Blocks in Modern FPGAs

A Case Study of Testing Strategy for AI SoC

FPGA based low-cost Portable Tester with On-Board Supplies

Interconnect Resources Multiple Faults Testing and Diagnosis in Field Programmable Gate Arrays