Investigation of Solution-Processed Ga2O3 Thin Films and Their Application in Dielectric Materials

Guang Shuo Cai,Yan Li Pei,Sheng Dong Zhang
DOI: https://doi.org/10.4028/www.scientific.net/msf.1014.27
2020-01-01
Materials Science Forum
Abstract:In this paper, polycrystal Ga2O3 thin films were grown on crystal n+-Si substrates by solution process. The XRD profile revealed that monoclinic β-Ga2O3 and rhombohedral α-Ga2O3 were coexisting in the film. The solution-process Ga2O3 film exhibited an ultrahigh transmittance (>97%) to a wavelength range of 280 nm~800 nm. The optical bandgap of ~5.0 eV and breakdown field of 4.2 MV/cm of the Ga2O3 thin film was obtained. Dielectric parameters such as capacitance, dielectric permittivity and loss tangent were investigated. It was observed that these parameters have a strong dependence on frequency.
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