Improved Tradeoff Between Subthreshold Swing and Hysteresis for MoS<sub>2</sub> Negative-Capacitance FETs by Optimizing Gate-Stack of Hf<sub>1-<i>x</i></sub>Zr<i><sub>x</sub></i>O<sub>2</sub>/Al<sub>2</sub> O<sub>3</sub>

Jingjie Wang,Lu Liu,Yuqin Xia,Jing-Ping Xu
DOI: https://doi.org/10.1109/TED.2021.3118330
IF: 3.1
2021-01-01
IEEE Transactions on Electron Devices
Abstract:MoS2 negative-capacitance field-effect transistors (NCFETs) with a gate-stack of Hf1-xZrxO2/Al2O3 are fabricated, and the effects of the Zr content and the thickness of the stacked gate on electrical performance of the devices are investigated. It is found that a large improvement of device performance can be achieved by optimizing these parameters, e.g., using 6-nm Hf0.5Zr0.5O2 (Zr content of 50%) as a ferroelectric layer and 2-nm Al2O3 as a matching layer, the relevant MoS2 NCFET exhibits the excellent electrical characteristics: a low subthreshold swing (SS) of 31.4 mV/dec, a smaller counterclockwise hysteresis of 75 mV, and a high ON/OFF current ratio of 3.26 x 10(6). The involved mechanisms lie in that: 1) an enhanced remnant polarization leads to low SS and 2) changing the thickness of the Hf1-xZrxO2 and Al2O3 can adjust the magnitude of ferroelectric capacitance and MOS capacitance to realize a reasonable match between both.
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