The Evidence for Interaction of the N-N Pair with Oxygen in Czochralski Silicon

MW QI,SS TAN,B ZHU,PX CAI,WF GU,XM XU,TS SHI,DL QUE,LB LI
DOI: https://doi.org/10.1063/1.348476
IF: 2.877
1991-01-01
Journal of Applied Physics
Abstract:Evidence for interaction between the N-N pair and interstitial O in N-doped Czochralski silicon has been presented by studying the annealing behavior of the corresponding IR absorption bands.
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