Study on Eliminating the Effect of Parasitic Reflection on Deflectometry Measurement of Planar Optical Element Surface Figure

Ruiyang Wang,Dahai Li,Kaiyuan Xu,Lei Tang,Pengyu Chen
DOI: https://doi.org/10.1117/12.2506462
2019-01-01
Abstract:Phase measuring deflectometry (PMD) with structured light projection and phase-shifting technique is a highly accurate optical surface measuring method. For surface shape measurement of transparent planar elements, PMD suffers from parasitic reflection. To avoid the unwanted effect of parasitic reflection, a method based on fringe frequency tuning and Fourier-transform is introduced in this paper. Numerical simulations and experiments are both conducted to evaluate the performance of the proposed method. An optical planar element with a thickness of 24.5mm is measured, and measurement error is within 200nm PV.
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