Optical Element Test with Multiple Surface Interference

REN Huan,MA Li,LIU Xu,HE Yong,ZHENG Wan-gu,ZHU Ri-hong
DOI: https://doi.org/10.3788/ope.20132105.1144
2013-01-01
Abstract:To eliminate the effect of multi-surface interferometric effect on the profile measurement of transparent elements,an interferometric fringe measuring method was proposed based on wavelength tuning and Fourier transfer.Firstly,according to the principle of wavelength-tuned phase shifing and the thickness of the element to be measured,the element was put a proper position in the test accordance with the proportional relation between cavity length and element thickness.And then,a group of interferograms were captured by the wavelength phase-shifting technology.Finally,with disperse Fourier transform for the group of interferograms,the frequency information for the front surface,back surface and thickness variation of the measured element was extracted and the accurate surface information and thickness information were obtained through a reconstruction algorithm.Experimental results indicate that the differences of PV and RMS for the front surface are 0.003 and 0.001,and those for the back surface are 0 and 0.001 respectively as compared with the traditional 13-step phase-shifting interferometry.These results satisfy the system requirements of the high precision test and the lustration test of the elements.
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