Silicon drift detector for characteristic X-ray spectrum and absorption experiment

Shu-neng RAN,Chun-yan JIA,Si-cheng WU
DOI: https://doi.org/10.3969/j.issn.1005-4642.2016.10.003
2016-01-01
Abstract:The characteristic X‐ray spectrum was measured using silicon drift detector ,the Mose‐ley law was verified ,and the shielding coefficient and its variation was calculated and explained .The absorption of the characteristic X‐ray spectrum of copper was investigated using nickel absorption sheets of different thickness .It was concluded that the optimum thickness of the nickel sheet required for the monochromatization of Cu characteristic spectrum was about 20 μm .
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