Abstract:The European X-ray Free Electron Laser (XFEL) will deliver 27000 fully coherent, high brilliance X-ray pulses per second each with a duration below 100 fs. This will allow the recording of diffraction patterns of single molecules and the study of ultra-fast processes. One of the detector systems under development for the XFEL is the Adaptive Gain Integrating Pixel Detector (AGIPD), which consists of a pixel array with readout ASICs bump-bonded to a silicon sensor with pixels of 200 {\mu}m \times 200 {\mu}m. The particular requirements for the detector are a high dynamic range (0, 1 up to 10E5 12 keV photons/XFEL-pulse), a fast read-out and radiation tolerance up to doses of 1 GGy of 12 keV X-rays for 3 years of operation. At this X-ray energy no bulk damage in silicon is expected. However fixed oxide charges in the SiO2 layer and interface traps at the Si-SiO2 interface will build up. As function of the 12 keV X-ray dose the microscopic defects in test structures and the macro- scopic electrical properties of segmented sensors have been investigated. From the test structures the oxide charge density, the density of interface traps and their properties as function of dose have been determined. It is found that both saturate (and even decrease) for doses above a few MGy. For segmented sensors surface damage introduced by the X-rays increases the full depletion voltage, the surface leakage current and the inter-pixel capacitance. In addition an electron accumulation layer forms at the Si-SiO2 interface which increases with dose and decreases with applied voltage. Using TCAD simulations with the dose dependent damage parameters obtained from the test struc- tures the results of the measurements can be reproduced. This allows the optimization of the sensor design for the XFEL requirements.

Abnormal Spectral Distortion Of A Silicon Sensor-Based Single Photon Counting Charge Coupled Device (Pixis-Xb: 1300r) In Detecting Laser Plasma X-Ray Source Of 20-100 Kev

Diagnostics for Ultrashort X-ray Pulses Using Silicon Trackers

Laser-induced Damage in a Silicon-Based Photodiode by MHz Picosecond Laser

X-ray imaging using a hybrid photon counting GaAs pixel detector

Study of Spectral Distortion in Pixel CZT Detector

Design and calibration of an elliptical crystal spectrometer for the diagnosis of proton-induced x-ray emission (PIXE)

Optimized Online Filter Stack Spectrometer for Ultrashort X-ray Pulses

Experimental Characterization of an X-ray Photon Counting Detector

Image Distortion by Ambiguous Multiple-Photon Detections in a Superconducting Nanowire Single-Photon Imager and the Correction Method.

High Performance Streaked X-ray Spectrometer for Research of Laser-Produced Plasmas

Silicon PIN Photodiode Applied to Acquire High-Frequency Sampling XAFS Spectra

Intrinsic XRF corrections in Timepix3 CdTe spectral detectors

Optimization of the Radiation Hardness of Silicon Pixel Sensors for High X-ray Doses using TCAD Simulations

Silicon Carbide Timepix3 detector for quantum-imaging detection and spectral tracking of charged particles in wide range of energy and field-of-view

Pixelated Energy-dispersive Photon-counting Detector Calibration with X-ray Diffraction

Sub-nanosecond time-resolved radiation measurement using x-ray focusing crystal spectrometers

Evaluation and synthesis of perovskite crystals as high-Z sensors for hybrid pixel detectors

An online readout CMOS detector to measure ion spectra produced by high-repetition-rate high-power lasers

CdTe Based Energy Resolving, X-ray Photon Counting Detector Performance Assessment: The Effects of Charge Sharing Correction Algorithm Choice

Signal Characteristics Study of Continuous Scintillator CCD-based Single Photon Counting (SPC) Detector

An optimized online filter stack spectrometer