Diagnostics for Ultrashort X-ray Pulses Using Silicon Trackers

Jiaxing Wen,Minghai Yu,Yuchi Wu,Ming Zeng,Bo Zhang,Jirong Cang,Yuge Zhang,Ge Ma,Yue Yang,Wenbo Mo,Zongqing Zhao

DOI: https://doi.org/10.1016/j.nima.2021.165754

2021-01-01

Abstract:The spectrum of laser–plasma generated X-rays is very important, it characterizes electron dynamics in plasma and is basic for applications. However, the accuracies and efficiencies of existing methods to diagnose the spectrum of laser–plasma based X-ray pulse are not very high, especially in the range of several hundred keV. In this study, a new method based on electron tracks detection to measure the spectrum of laser–plasma produced X-ray pulses is proposed and demonstrated. Laser–plasma generated X-rays are scattered in a multi-pixel silicon tracker. Energies and scattering directions of Compton electrons can be extracted from the response of the detector, and then the spectrum of X-rays can be reconstructed. Simulations indicate that the energy resolution of this method is approximately 20% for X-rays from 200 to 550 keV for a silicon-on-insulator pixel detector with 12 μm pixel pitch and 500 μm depletion region thickness. The results of a proof-of-principle experiment based on a Timepix3 detector are also shown.