Tilted Angels of ZnTe and CdTe Epilayers Grown on Si(211) and GaAs(211)B Substrates by MBE

WANG Yuan-Zhang,CHEN Lu,WU Yan,WU Jun,YU Mei-Fang,FANG Wei-zheng,HE Li
DOI: https://doi.org/10.3969/j.issn.1000-985x.2005.04.018
2005-01-01
Abstract:Measurements using X-ray double crystal diffraction(XDCD) were carried out to investigate the tilted angels of ZnTe and CdTe epilayers grown on 76mm Si(211) and GaAs(211)B substrates by molecular-beam epitaxy. The results show that the epilayer's tilts toward about the coincidence axis, independent of the substrates employed. Further more, a linear relationship of tilted angles and lattice mismatch between the epilayer and substrate was found. It was also confirmed that peak of the epilayer corresponds to [255], which is the first-order twin of about twist axis.
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