Abstract:Background:The digital to analog converter (DAC) used in space-borne electronic system is unavoidable to be affected by the radiation, and it is essential to evaluate the DAC performance before formal application. Purpose:This study aims to develop an automatic measurement system of high-accuracy and high-speed for radiation-tolerance evaluation of space-borne D/A converters.Methods:Based on the peripheral component interconnection extensions for instrumentation (PXI), Kelvin (4-wire) method and mean filtering algorithm are applied to accurately monitor the voltage and current of the DAC chip, and a switch matrix configured in software is adopted to automatically switch over measurements of different parameters. Meanwhile the PXI bus synchronization and trigger mode control are used to achieve high-speed response among modular instruments, and the cubic spline algorithm is performed to accurately extract the single event saturated cross section and linear energy transfer threshold.Results:The identified voltage precision is 0.1μV, and the DAC monitoring precision is up to 24 bit. In single event effects evaluation, the monitoring frequency of current variation and register upset are 50 Hz and 100Hz respectively, and for total dose effect evaluation, only 8-s ergodic time are needed to measure all characteristic parameters.Conclusion:The designed measurement system can evaluate the performance of space-born DAC fully automatically and efficiently with high precision, which is a reference solution to such similar research.

Total Ionizing Dose Effect on 12-bit LC2 MOS Digital-to-analog Converter

Development of radiation tolerance evaluation and measurement system for spaceborne D/A converter

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Effect of ionizing radiation on dual 8-bit analog-to-digital converters (AD9058) with various dose rates and bias conditions

Different Dose Rate Radiation Effects on Linear CCDs

Total Dose Effects with High Dose Rate in NMOS Transistors

Total Ionizing Dose Effect and Single Event Burnout of VDMOS with Different Inter Layer Dielectric and Passivation.

Total Dose Radiation Effects on COTS Array CCDs at Low Dose Rate

Cobalt-60 Experiment on Ionization Radiation Effects of Charge Coupled Devices

Dose Rate Effects on Array CCDs Exposed by Co-60 Γ Rays Induce Saturation Output Degradation and Annealing Tests

Effect of ionizing radiation on dual 8-bit analog-to-digital converters （AD9058） with various dose rates and bias conditions

Primary Total Ionizing Dose Effect Studies on Xilinx SoC Irradiated with 60co Γ Rays

Analysis of Experiments on Total Dose Radiation Effects on TCD132D Linear CCD

γ-Radiation Total Dose Effects of Different Sized MOS Devices

Effects of Electron and Gamma-Ray Irradiation on Cmos Analog Image Sensors

Influence of LDD Spacers and H+Transport on the Total-Ionizing-Dose Response of 65-Nm MOSFETs Irradiated to Ultrahigh Doses

Radiation Effects on Scientific CMOS Detectors for X-ray Astronomy: II. Total Ionizing Dose Irradiation

Total Dose Effect on Mismatch Performance of 0.18 Μm MOS Differential Pair Transistors

Total Ionizing Dose Effects on a Radiation-Hardened CMOS Image Sensor Demonstrator for ITER Remote Handling

Synergistic effect of enhanced low-dose-rate sensitivity and single event transient in bipolar voltage comparator LM139

The enhanced low dose rate sensitivity of a linear voltage regulator with different biases