Radiation Effects on Scientific CMOS Detectors for X-ray Astronomy: II. Total Ionizing Dose Irradiation

Mengxi Chen,Zhixing Ling,Mingjun Liu,Qinyu Wu,Chen Zhang,Jiaqiang Liu,Zhenlong Zhang,Weimin Yuan,Shuang-Nan Zhang

2024-03-23

Abstract:Complementary metal-oxide-semiconductor (CMOS) detectors are a competitive choice for current and upcoming astronomical missions. To understand the performance variations of CMOS detectors in space environment, we investigate the total ionizing dose effects on custom-made large-format X-ray CMOS detectors. Three CMOS detector samples were irradiated with a Co-60 source with a total dose of 70 krad and 105 krad. We test and compare the performance of these detectors before and after irradiation. After irradiation, the dark current increases by roughly 20 to 100 times, and the readout noise increases from 3 e- to 6 e-. The bias level at 50 ms integration time decreases by 13 to 18 Digital Number (DN) at -30 degree. The energy resolution increases from about 150 eV to about 170 eV at 4.5 keV at -30 degree. The conversion gain of the detectors varies for less than 2% after the irradiation. Furthermore, there are about 50 pixels whose bias at 50 ms has changed by more than 20 DN after the exposure to the radiation and about 30 to 140 pixels whose readout noise has increased by over 20 e- at -30 degree at 50 ms integration time. These results demonstrate that the performances of large-format CMOS detectors do not suffer significant degeneration in space environment.

Instrumentation and Methods for Astrophysics,High Energy Physics - Experiment,Instrumentation and Detectors

What problem does this paper attempt to address?

The paper aims to study the performance variations of Complementary Metal-Oxide-Semiconductor (CMOS) detectors in a space radiation environment, particularly focusing on the effects of Total Ionizing Dose (TID) on large-format X-ray CMOS detectors. Specifically, the study conducted irradiation experiments on three CMOS detector samples using different doses of cobalt-60 radiation sources, analyzing the changes in various performance indicators of the detectors before and after irradiation, including dark current, readout noise, gain, and energy resolution. The research results indicate that under high-dose radiation, the dark current of the detectors significantly increases, the readout noise also rises, but the conversion gain changes little, and the energy resolution moderately decreases. Overall, these results suggest that large-format CMOS detectors can maintain relatively stable performance in space environments, making them suitable for future X-ray astronomy missions.