3D Simulation of Mutil-Gate MOSFET with Sub-100nm

夏志良,刘晓彦,刘恩峰,韩汝琦
DOI: https://doi.org/10.3969/j.issn.1674-4926.2003.z1.032
2003-01-01
Chinese Journal of Semiconductors
Abstract:The characteristics of mutil-gate MOSFET ( double gates and trible gates FINFET) are simulated systemically by Using 3D simulation prsgram ISE. The I-V characteristics are investigated. The results show that the performances of Tri gate MOSFET are generally superior to ones of double gate's. However, With the decreasing of the FIN's width, double gate's performances trend to Tri gatre's.
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