Study of 20nm bulk FINFET by using 3D full band Monte Carlo method with Effective Potential Quantum Correction

Gang Du,Wei Zhang,Juncheng Wang,Tiao Lu,Pingwen Zhang,Xiaoyan Liu
DOI: https://doi.org/10.1109/ICSICT.2010.5667816
2010-01-01
Abstract:As MOSFETs scaling down to nano-scale, short channel effect(SCE) become a critical issue. Multiple channel MOSFET structure such as FINFET has well gate controllability on channel charge, and will be used in nano-scale CMOS technology. In this work the performance of 20nm bulk FINFET is investigated by Using 3D full band Monte Carlo Method with Effective Potential Quantum Correction. Gate and drain bias affect on the carrier density, velocity and energy distribution are introduced. The transit time and SSEC Cgs and Cgd as a function of Vds are showed. Results show about 0.1 psec intrinsic transit time at on state in this 20nm gate length device.
What problem does this paper attempt to address?