A comparative study on electrothermal characteristics of nanoscale multiple gate MOSFETs.

Qi-Lin Gu,Peng Zhang,Yi Ru,Hao Song,Wen-Sheng Zhao,Wen-Yan Yin
DOI: https://doi.org/10.1016/j.microrel.2017.09.003
IF: 1.6
2017-01-01
Microelectronics Reliability
Abstract:Multiple-gate (MG) MOSFETs are promising candidates for next-generation integrated circuits technology. This paper presents the electrothermal characterization of three-type nanoscale MG MOSFETs, i.e., Π-gate, quadruple-gate (QG), and Ω-gate MOSFETs. Meanwhile, the temperature distribution of a real Ω-gate MOSFET with gradual channel width is also studied. Finite difference method (FDM) is adopted to solve the 3-D time-dependent heat conduction equations. The simulation results of the steady-state temperature distribution are validated against the commercial software COMSOL. Moreover, the transient temperature response of MG MOSFETs to different waveforms are also captured and compared.
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