Effects of Precursor Solution Concentration on the Properties and Morphology of Ybco Films Deposited by Tfa-Mod Method

XM Cui,BW Tao,YR Li,XZ Liu,JJ Chen,J Xiong
IF: 6.318
2005-01-01
Rare Metals
Abstract:Epitaxial YBCO films were deposited on (100) LaAlO3 single-crystal substrates by metalorganic deposition of metal trifluoroacetate precursors with different concentrations. All the YBCO films have T-c around 91 K and J(c) excess 2 MA/cm(2) at 77 K in zero field. XRD theta-2 theta scans show all the films have c-axis normal orientation. The FWHM (full width at half-maximum intensity) values of X-ray omega-scans of (005) reflection are 0.379 degrees, 0.283 degrees, and 0.543 degrees for the YBCO thin films deposited with precursor solution concentrations of 1.52, 1.0, and 0.75 mol/L, respectively. With the concentration of the precursors decreasing, the thickness of the films decreases linearly. SEM micrographs show that porosities in the films become bigger with the precursor solution concentration decreasing. The big porosities in the film with the lowest concentration precursor deteriorate the superconducting property and make it have a wider superconducting transition and a lower J(c).
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