NF 3 and F 2 gas fluorination of GaN surface and Pt/GaN interface analyzed by hard X-ray photoelectron spectroscopy

Asahiko Matsuda,Takashi Teramoto,Takahiro Nagata,Dominic Gerlach,Peng Shen,Shigenori Ueda,Takako Kimura,Christian Dussarrat,Toyohiro Chikyow
DOI: https://doi.org/10.1016/j.apsusc.2024.159941
IF: 6.7
2024-03-21
Applied Surface Science
Abstract:The effects of NF 3 or F 2 gas annealing on epitaxially grown GaN and its interface with sputter-deposited Pt were investigated using hard X-ray photoelectron spectroscopy. Annealing GaN and Pt/GaN samples in an NF 3 atmosphere led to the emergence of prominent F 1 s peaks and chemically shifted Ga 2 p peaks, indicating the efficient formation of Ga–F x species not only in the bare GaN surface but also in the Pt/GaN interface, even when the NF 3 treatment was performed after the Pt was deposited. By contrast, F 2 annealing also led to the fluorination of the GaN surface and nonfluorination of the Pt/GaN interface. Although the plasma sputtering process removed F from the surface, band shifts were observed when the treatment conditions were varied. The findings in this study suggest that NF 3 treatment is an effective post-processing method for fluorinating GaN-based systems before or after metal deposition.
chemistry, physical,physics, applied, condensed matter,materials science, coatings & films
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