Influence of Nitridation on III-nitride Films Grown on Graphene/quartz Substrates by Plasma-Assisted Molecular Beam Epitaxy

Jiadong Yu,Zhibiao Hao,Jun Deng,Wangyang Yu,Lai Wang,Yi Luo,Jian Wang,Changzheng Sun,Yanjun Han,Bing Xiong,Hongtao Li
DOI: https://doi.org/10.1016/j.jcrysgro.2020.125805
IF: 1.8
2020-01-01
Journal of Crystal Growth
Abstract:Growing III-nitride semiconductors on non-single-crystalline substrates at low temperature is essential to realize low-cost and large-area GaN-based transferable and flexible devices. Two-dimensional (2D) layered materials such as graphene have the similar in-plane lattice arrangements compare with III-nitrides, hence III-nitrides can be grown on various non-single-crystal substrates through van der Waals epitaxy (vdWE) assisted by 2D layered material. Nevertheless, because of the low chemical reactivity of perfect graphene surface, it is hard to obtain high-quality GaN thin film with smooth surface without any artificial treatments at the initial stage of epitaxy growth. In this work, the influence of nitridation process on vdWE grown III-nitride films on graphene/quartz substrates has been investigated by using plasma-assisted molecular beam epitaxy. It is demonstrated that moderate intentional defects can be introduced into the surface of graphene/quartz substrate by N-2 plasma treatments in the initial stages of vdWE, which is beneficial to the following nucleation process of III-nitrides. Besides, suitable nitridation conditions are essential in order to obtain high-quality GaN film on graphene/quartz substrates at low growth temperature. Such results can act as paradigms for vdWE of III-nitrides when using other 2D layered materials or non-single-crystalline substrates.
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