Study on Melting and Deflagration of Nanometer-Sized Indium Particle Thin Films by Temperature-Dependent Ellipsometry

Pian Liu,Yao Shan,Huatian Tu,Yao Chen,Haotian Zhang,Yuxiang Zheng,Rongjun Zhang,Songyou Wang,Jing Li,Liangyao Chen
DOI: https://doi.org/10.1021/acs.jpcc.0c01417
2020-01-01
The Journal of Physical Chemistry C
Abstract:The melting and deflagration of nanometer indium particle thin films with an average diameter of 43.2 nm were characterized by temperature-dependent ellipsometry. During ellipsometric measurement, the sample temperature varied from room temperature to 270 degrees C. Two sharp breakpoints in the temperature-dependent curves of ellipsometric parameters were found at 155 and 251 degrees C, respectively. The former sharp breakpoint at 155 degrees C is ascribed to a physical phase change from solid to liquid, and the later one at 251 degrees C is due to the chemical phase change from liquid indium to solid indium oxide. The temperature of 251 degrees C is just the deflagration point of liquid indium particles, which was observed with temperature-dependent ellipsometric measurement for the first time. The results given by ellipsometry were further confirmed by conventional measurements of differential scanning calorimeter, thermogravimetric analysis, and X-ray diffraction. Compared with conventional measurements, the ellipsometric method is more sensitive and effective.
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