Low Temperature X-Ray Diffraction Study On Phase Transitions

H. Suzuki,Hiroshi Kaneko,Yun Xue,N. Shumsun,Andrey V. Savinkov,Hui Xing,Z. A. Xu,Shuai Zhang,Yosikazu Isikawa
DOI: https://doi.org/10.1088/1742-6596/400/2/022118
2012-01-01
Abstract:By using the low temperature x-ray diffraction (LTXD) we investigated several phase transitions which accompany with the crystal distortion. In our present report we will mainly discuss the integrated intensity (I.I.) of the x-ray spectrum. The temperature dependence of I.I. can be expressed by the Debye-Waller factor. As a precursor effect of the crystal phase transition, the softening of the lattice occurs. Due to the softening of the lattice, the I.I. drastically decreases down to the crystal phase transition temperature. We observed this effect in many materials. Here we will show some of them, iron pnictide superconductor SmFe0.925Co0.075AsO, and magnetic ordering compounds PrCu4Ag and Nd2Ti2O7.
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