Dielectric Properties of (yb0.5ta 0.5)xti1−xo2 Ceramics with Colossal Permittivity and Low Dielectric Loss

Lei Jiao,Pengwei Guo,Defu Kong,Xinpeng Huang,Hui Li
DOI: https://doi.org/10.1007/s10854-020-02923-9
2020-01-01
Journal of Materials Science Materials in Electronics
Abstract:High dielectric loss is one of the current obstacles to the application of dielectric materials. In this paper, we synthesized a new dielectric material, i.e., (Yb + Ta)-co-doped TiO2 dielectric material. The (Yb0.5Ta0.5)xTi1−xO2 ceramics were synthesized by the solid-state reaction method. It has been found that (Yb0.5Ta0.5)xTi1−xO2 ceramics had a dense ceramic microstructure, and (Yb0.5Ta0.5)xTi1−xO2 ceramics exhibited the rutile TiO2 structure. All (Yb0.5Ta0.5)xTi1−xO2 ceramics exhibited low dielectric loss (< 0.1) and large dielectric constant (> 105). The optimal dielectric properties are obtained at a doping level of x = 0.05 with dielectric constant of 5.1 × 105 and dielectric loss of 0.037. Further study of the thermal stability of the dielectric properties was performed in the temperature range from − 50 to 250 ℃, which indicates that the ceramic sample with x = 0.05 co-dopant concentration maintains good dielectric properties in the temperature range from − 50 to 100 ℃. XPS shows that high dielectric properties can be explained by the electron-pinned defect-dipole mechanism.
What problem does this paper attempt to address?