Abstract:This study systematically investigated the structural, dielectric, and ferroelectric properties of BaAl(2-2x)(Mg0.5Ti0.5)(2x)O-4 ceramics in the 0 <= x <= 0.04 range. Single-phase solid solutions in the P6(3) space group with hexagonal crystal symmetry were confirmed in the composition range of 0 <= x <= 0.03. The bond lengths of Al1/(Mg,Ti)-O, Al-2/(Mg,Ti)-O, and Al-3/(Mg,Ti)-O increased with the increase in x, as confirmed through the Rietveld refinement and evolutions of corresponding modes in Raman spectra. The temperature stability of dielectric properties improved at a composition around x = 0.03, and the dielectric constant epsilon(r) ascended with the increase in x. Ultrabroad temperature stability (-100 degrees C to 700 degrees C) was obtained, and an optimal combination (epsilon(r) = 18.5, tan delta < 10(-3), -22 ppm/degrees C <= TCC <= +20 ppm/degrees C, resistivity similar to 4.5 x 1014 omega center dot cm) was achieved for the x = 0.03 ceramic sintered at 1260 degrees C in air for 6 hours. The increase in stability was ascribed to the variations in axial bonds, and lattice distortions were determined through high-resolution transmission electron microscopy. The x = 0.03 ceramic could be a promising candidate for C0G or NP0 multilayer ceramic capacitors because of its low loss, high reliability, superior insulating properties and comparatively low-cost raw materials.

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