Temperature-dependent Structure, Dielectric Properties of Bi0.95Ba0.05Fe0.95Ti0.05O1.3

G. F. Cheng,H. D. Yin,Y. J. Ruan,Q. Y. Xie,X. S. Wu
DOI: https://doi.org/10.1142/s0217979219503181
2019-01-01
Abstract:The temperature-dependent structure and dielectric properties of Bi[Formula: see text]Ba[Formula: see text]Fe[Formula: see text] Ti[Formula: see text]O3 ceramic are studied systematically. At the temperature range of 25–800[Formula: see text]C, the cell parameters are increasing, this indicates its distorted rhombohedral [Formula: see text]3[Formula: see text] structure. A structural phase transformation from rhombohedral [Formula: see text]3[Formula: see text] to cubic Pm3[Formula: see text] is observed at 850[Formula: see text]C. The thermal expansion coefficients in the temperature range 25–700[Formula: see text]C are calculated. Meanwhile, the temperature-dependent dielectric constant ([Formula: see text]) and dielectric loss ([Formula: see text][Formula: see text]) at different frequencies are measured. This work attempts to show the thermodynamic stability and the effect of charge defects on the electric properties for doped BiFeO3 ceramics.
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