Abstract:As the technology node shrinks to the nanometer scale, process variation become one of the most important issues in IC designs. The industry calls for designs with high yield under process variations. Yield optimization is computationally intensive because traditionally it relies on the Monte-Carlo yield estimation. In this paper, we will first review the Bayesian methods that reduce the computational cost of yield estimation and optimization. By applying Bayes' theorem, maximizing the circuit yield is transformed to identify the design parameters with maximal probability density, conditioning on the event that the corresponding circuit is “pass”. It can thus avoid repetitive yield estimations during optimization. The computational cost can also be reduced by using the Bayesian optimization strategy. By using the Gaussian process surrogate model and adaptive yield estimation, Bayesian optimization can significantly reduce the number of simulations while achieving even comparable yields for analog and SRAM circuits. We further propose a Bayesian optimization approach for yield optimization via maxvalue entropy search in this paper. The proposed max-value entropy search can better explore the state space, and thus reduce the number of circuit simulations while achieving competitive results.

A Study on the Methodology of IC Yield Optimization

A New Yield Optimization Algorithm and Its Applications

A Fast Method for Extracting and Optimizing Critical Area to Improve Yield

Bayesian Methods for the Yield Optimization of Analog and SRAM Circuits

Design Time Body Bias Selection for Parametric Yield Improvement.

MAXIMUM LIKELIHOOD ESTIMATION FOR FAILURE ANALYSIS OF SRAM CELLS USING INDUCTIVE FAULT ANALYSIS

A Silicon-Validated Methodology for Power Delivery Modeling and Simulation

Efficient Bayesian Yield Optimization Approach for Analog and SRAM Circuits

An Efficient SRAM Yield Analysis and Optimization Method with Adaptive Online Surrogate Modeling

A New Via Chain Design Method Considering Confidence Level and Estimation Precision

An Efficient and Robust Yield Optimization Method for High-dimensional SRAM Circuits.

State of the Art on Study of Parametric Yield and Its Optimization for VLSI

Efficient Yield Optimization for Analog and SRAM Circuits Via Gaussian Process Regression and Adaptive Yield Estimation

Parametric Yield Optimization Based on RSM and Uniform Experiment Design

Efficient SRAM yield optimization with mixture surrogate modeling

Sensitivity Importance Sampling Yield Analysis and Optimization for High Sigma Failure Rate Estimation.

An Efficient Yield Optimization Method for Analog Circuits Via Gaussian Process Classification and Varying-Sigma Sampling

New Assessment Methodology Based on Energy–Delay–Yield Cooptimization for Nanoscale CMOS Technology

A Yield-Enhanced Global Optimization Methodology for Analog Circuit Based on Extreme Value Theory

Yield Driven Design and Optimization for Near Threshold Voltage Sram Cells

A novel optimal model of and the solution to the layer yield of IC's