A Fast Method for Extracting and Optimizing Critical Area to Improve Yield

Luo Xiao-hua
2013-01-01
Abstract:Design for yield(DFY) has become inevitable trend in IC design.As for the yield related to random defect,the purpose of DFY is optimizing critical area of a design layout to improve yield.Aiming at the massive re-extraction of critical area after modifications to the layout,this paper proposes a new method to deal with this problem.The new critical area can be fast extracted and the best modification option can be fast determined,which results in a higher yield with less computational time cost of DFY flow.
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