Abstract:With the continuous innovation and improvement of electronic information and systems, the transmission power in the equipment is also increasing. For the propagation of high-power microwaves, not only the transmission characteristics of high-power microwaves should be considered, but also the protection measures should be taken to prevent the damage caused by excessive pulses on the back-end equipment. In this article, the characteristics of waveguide plasma limiter are studied based on the plasma formed by low pressure microwave gas discharge, which reflects and absorbs electromagnetic waves. At the same time, in response to the potential power leakage problem of single-stage plasma limiters in protecting high-power microwaves, a protective device is proposed for the combination of plasma limiters and PIN limiters in rectangular waveguides. When the incident microwave intensity is strong, the electronic components are protected from burning by plasma. When the front-end plasma limiter fails to exert its effect and causes power leakage, the transmitted microwave energy is attenuated by the subsequent PIN diode limiter circuit, causing its strength to fall below the safety threshold. This limiter system model can be controlled and described by the electromagnetic (EM) fields, plasma physics and PIN equivalent circuit model. In the multi-physics cascaded waveguide limiter system, the spectral-element time-domain (SETD) method is used for system integration and self-consistent simulation analysis. The results show that the limiting performance of the cascaded limiter is much better than that of the single-stage plasma limiter under the action of HPM pulses. This research provides theoretical guidance for the use of plasma limiting devices to protect against high-power microwave damage.

STUDY OF NONLINEAR EFFECT ON ELECTRONIC SYSTEM INDUCED BY TVS LIMITER WHEN ILLUMINATED BY HPEM PULSE

Immunity Analysis and Experimental Investigation of a Low-Noise Amplifier Using a Transient Voltage Suppressor Diode under Direct Current Injection of HPM Pulses

Electro-Thermo-Mechanical Investigation On Multi-Level Interconnects In The Presence Of An Esd Pulse

Research on the Influence of Current Limiter Based on Highly Coupled Split Reactor on Main Circuit Breaker Overvoltage

Trigger voltage walk-in effect of ESD protection device in HVCMOS

Simulation Analysis of High Power Microwave Propagation Properties in a Simplified Plasma Limiter

Efficient Nonlinear Behavior Modeling Method for Voltage-Variable Capacitors

Effects of Non-Fatal Electrostatic Discharge on the Threshold Voltage Degradation in Nano CMOS Devices

Transient Voltage Suppressor Diode Array Protection Circuits with Reducing Loading Effect under High-Power Microwave Pulse Injection

Investigation of the Trigger Voltage Walk-In Effect in Ldmos for High- Voltage Esd Protection

Simulation of Simplified Cascade Waveguide Plasma Limiter under High Power Microwave

Impact on Transient State Stability of Power System by Solid State Current Limiter

The Effect of Frequency on the Thermal Effect of High Power Microwave Pulses on a PIN Limiter

Effects of process variation on turn-on voltages of a multi-finger gate-coupled NMOS ESD protection device

Investigation of Turn-on Speeds of Electrostatic Discharge Protection Devices Using Transmission-Line Pulsing Technique

A Coupled 3D Finite Element-Circuit Model for the Numerical Analysis of Small Time Scale Transients of an Insulated Gate Bipolar Transistor Power Electronics Device

Simulation Research on the Effect of the Paralleled Compensating Capacitor on the Solid State Fault Current Limiter Operation

Effect of poly-silicon gate on ESD protection performance of LDMOS-SCR devices

An enhanced TLP system for ESD characterization in semiconductor technologies

Transient Response of Transient Voltage Suppressor Device under EMP with Fast Rise Time

Numerical Investigations into the Homogenization Effect of Nonlinear Composite Materials on the Pulsed Electric Field