Low-temperature Electrical Characterization of P- and N-Type MoTe2 Transistors

Wenjie Chen,Renrong Liang,Jun Xu
DOI: https://doi.org/10.1109/edssc.2019.8753960
2019-01-01
Abstract:We have fabricated high performance p- and n-type molybdenum ditelluride (MoTe2) transistors and demonstrated their temperature dependent characteristics. The carrier mobility increases and the absolute value of threshold voltage decreases with the rise of temperature for both p- and n-type MoTe2 transistors. Furthermore, the slopes of threshold voltage shift with temperature are estimated to be 171 mV/K and 71 mV/K for p- and n-type MoTe2 transistors, respectively. The large difference results from their different carrier transport mechanisms. These results open opportunities to facilitate the development of high-performance functional devices based on two-dimensional layered semiconductors in the future.
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