The Influence of Gate Line Edge Roughness and Thickness of Silicon Film on the Performance of UTBB MOSFETs

Yuqi Ren,Lei Shen,Kunliang Wang,Wangyong Chen,Liqiao Liu,Shizhen Huang,Gang Du,Xiaoyan Liu
DOI: https://doi.org/10.1109/icsict.2018.8564861
2018-01-01
Abstract:In this work, we use statistical three-dimensional(3-D) simulations to evaluate the impact of the gate line edge roughness and thickness of silicon film on the performance of Ultra-Thin Body and Buried oxide(UTBB) MOSTEFs through two hundred devices are set by TCAD tools. The line edge roughness is introduced using a Fourier synthesis technique based on the power spectrum of a Gaussian autocorrelation function and the choices of thickness of silicon film is in accordance with current technological level.
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