Method for measuring thermal contact resistance of graphite thin film materials

Xiaogang Li,Renxi Luo,Weifang Zhang,Haitao Liao
DOI: https://doi.org/10.1016/j.measurement.2016.07.015
IF: 5.6
2016-01-01
Measurement
Abstract:•Thermal contact resistance values of graphite thin film materials are measured.•An indirect steady-state method using a copper heat flux meter is developed.•Results guide the use of the material in high-temperature and -pressure condition.
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