Measurement Methods and Applications for Thermophysical Properties at Micro/Nanoscales

Jianli Wang,Xing Zhang
DOI: https://doi.org/10.1143/jjap.50.11rc01
IF: 1.5
2011-01-01
Japanese Journal of Applied Physics
Abstract:The effect of thermal contact resistance (TCR) on the measurement of thermal properties of micro/nanowires is investigated using the changing length T type probe and the 3ω-T type probe. For the junction established by two crossed platinum microwires, the TCR is found to decrease as temperature increases, which can be possibly explained by the plastic deformation of the microscopic contacts. The same value of thermal effusivity of the test wire is obtained in the presence of different interstitial materials, and the one with small thermal impedance will give a decrease in the temperature oscillation of the hot wire. Based on this fact, the thermal conductivity and thermal effusivity of individual carbon fibers heat treated at 2800 and 1000 °C are measured, and the calculated specific heat is found to decrease with increasing heat-treatment temperature and to approach the value of graphite.
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