Development of Photothermal-Resistance Technique and Its Application to Thermal Diffusivity Measurement of Single-Wall Carbon Nanotube Bundles

J Hou,X Wang,C Liu,H Cheng
DOI: https://doi.org/10.1063/1.2199614
2006-01-01
Abstract:In this work, a photothermal-resistance technique is developed to characterize the thermophysical properties of one-dimensional micro/nanostructures. In this technique, a periodically modulated laser beam is used to achieve noncontact heating of suspended individual wires. The temperature response of the sample is monitored by measuring its electrical resistance variation. A 25.4 mu m thick platinum wire is used as the reference sample to verify the technique. Applying the photothermal-resistance technique, the thermal diffusivity of single-wall carbon nanotube bundles is measured. The measured thermal diffusivities for three different single-wall carbon nanotube bundles are 2.98x10(-5), 4.41x10(-5), and 6.64x10(-5) m(2)/s, respectively. These values are much less than the thermal diffusivity of graphite. (c) 2006 American Institute of Physics.
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