Comparison of quantum dot growth and annealing conditions between self-assembled InAs/GaAs and InGaAs/GaAs

HE Hao,HE Ye-quan,YANG Zai-rong,LUO Zi-jiang,ZHOU Xun,DING Zhao
DOI: https://doi.org/10.13385/j.cnki.vacuum.2011.01.030
IF: 4
2011-01-01
Vacuum
Abstract:Investigates the growth of InAs/GaAs and InGaAs/GaAs quantum dots via MBE,with RHEED used for real-time monitoring of film surface morphology and for growth rate measuring through intensity fluctuation.Comparing the growing process of quantum dots and annealing conditions of InAs/GaAs with that of InGaAs/GaAs,it was found that if the RHEED pattern changes to spotty from streaky the changing time required for InAs is far shorter than that for InGaAs.By contrast,if the RHEED pattern changes reversely during high-temperature annealing,the time required for InAs is longer than that for InGaAs.
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