Stimulated Emission of Silicon-based Quantum Dot Oxygenated

CAI Cheng-lan,HUANG Wei-qi,LIU Jia-xing,SU Qin,CHEN Han-qiong
DOI: https://doi.org/10.3969/j.issn.1000-5269.2012.02.003
2012-01-01
Abstract:Silicon-based Quantum Dot Structures was prepared by Nanosecond Laser Pulses after the crystallization at the optimal annealing condition,the peaks of stimulated emission were observed at 605nm and 693nm which have optical gain and threshold behavior obviously.By building Si-O-Si and Si=O bond on the surface of Quantum Dot,using the first principles method,the density of state of Silicon-based Quantum Dot in oxygen was simulation calculated.The results indicate that the two type bonds in Quantum Dot were forming Localized States in different positions.Integrate theory with practice,the main reasons were elaborated for the optical gain and threshold behavior and proposes a new conception of nano-laser,and the pumping level of laser determined by the quantum confinement(QC) effect and the localized states are necessary condition for population inversion formed between the valence band and conduction band.
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